X-Ray Fluorescence
(XRF)

XRF spectrometry is the analytical technique of using X-rays to excite the atoms within a sample to cause ionization. Ionization consists of the ejection of one or more electrons from the atom’s inner orbitals. The removal of an electron renders the electronic structure of the atom unstable, causing electrons in higher orbitals to “fall” into the lower orbitals. In falling, energy is released in the form of a photon effectively emitting radiation. The fluorescent radiation can be analyzed either by sorting the energies of the photons (energy-dispersive analysis) or by separating the wavelengths of the radiation (wavelength-dispersive analysis). Once sorted, the intensity of each characteristic radiation is directly related to the amount of each element in the material. Samples received by AAL will be fluxed with Li2B4O7 and LiNO3 in platinum crucibles before analysis on Zetium WD-XRF (Panalytical). WD-XRF is particularly helpful for heavier elements (Ex. Pb, Zn, Cu and Fe) in higher concentrations.